Produkte > Probe Cards > Cantilever

Probe Cards

Cantilever probe cards are based on the approved epoxy ring design. The technology is suitable for pads as well as for bumps. Different needle materials, diameters and tip diameters give the customer the chance to cover a wide range of applications.


  • Fast lead time
  • High flexibility and customization possible
  • High current applications
  • Dual temperature possible – wide temperature range
  • Mature and robust technology


Application examples

Single DUT SOC

  • Needle diameter: 6 mil
  • Needle pitch: 150 µm
  • Tester: MT256

Single DUT - Controlled beam length and balanced contact force

  • Needle diameter: 4 mil
  • Needle pitch: 100 µm
  • Teser SP128



Specifications at a glance

Contact elements: 4 mil to 12 mil (customized)
Pitch: down to 65 µm
Beam count: up to 1 000
Needle material: Rhenium Tungsten (ReW), Harden BeCu - Trivar®
Temperature range: -40°C up to 180°C