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ViProbe®

Vertical
Probe
Cards

FEINMETALL ViProbe® is a buckling beam technology for contacting pads. The contact can be done with and without scrub – depending on the application. It fits for contacting on aluminum-, copper-, gold-, palladium- and other pads.

Advantages

  • Excellent temperature behaviour
  • Easy maintenance & service
  • Easy exchange of beams
  • Precise alignment over the entire lifetime
  • Robustness

 

Application examples

ViProbe® - SOC

  • Wired connector
  • Head size 45 mm x 45 mm
  • Beam count: 1 440
  • Beam size: 2,5 mil
  • 24 DUT
  • Tester: Teradyne J750

ViProbe® - Multi DUT MCU

  • MLC Space transformer connector
  • Head size 40 mm x 40 mm
  • Pin count: 5 000
  • Beam size: 1,6 mil
  • 32 DUT
  • Tester: Advantest V93000

ViProbe® - High Multi DUT Digital

  • Direct attach connector
  • Head size: 80 mm x 80 mm
  • Pin count: 5 100
  • Beam size: 2 mil
  • 1700 DUT
  • Tester: Advantest J996

Specifications at a glance

Contact elements: 3 mil - 2,5 mil - 2 mil - 1,6 mil
Pitch: down to 56 µm
Beam count: more than 10 000
Active Area: up to 100 mm x 100 mm
Temperature range: -55 °C to 180 °C